Figure 1. SAXS tensor tomography on the example of bone reveal the orientation of nanometer sized collagen fibrils within a macroscopic sample. With the extension of WAXS tensor tomography structural information and orientation of crystalline planes can be simultaneously obtained.
X-ray imaging for hierarchical materials
Befordransföreläsning av Marianne Liebi för titeln som oavlönad docent.
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Microscopy in scanning mode allows to image different contrasts from the sample, by probing not only absorption and phase contrast of the sample but for example a full X-ray fluorescence spectrum or a 2D scattering pattern. Small- angle X-ray scattering (SAXS) imaging is in particular valuable for heterogeneous samples, in which structural elements in the nanoscale change over macroscopic length scales, thus several millimeters or centimeters. The SAXS patterns provide statistical information about the nanostructure in each scan point, thus this method is complementary to high-resolution imaging techniques, such as electron microscopy. The information extracted from each scattering pattern can be used to create images with different contrast, such as density of nano-scale features or orientation of nanostructures. With wide-angle X-ray scattering (WAXS) orientation and length scales of crystalline planes can be simultaneously obtained. These methods can also be combined with computed tomography to study the inside of three-dimensional samples, as shown on the example of bone in Figure 1.
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