The Leica EM TIC 3X Triple Ion-Beam Cutter is used for producing large, broad cross sections; up to a few millimeters in width and several hundred microns in depth, of samples for subsequent electron microscope or light microscope examination. A wide range of samples, including polymers, metal and semiconductors can be processed. The milling is performed by argon ion beams in the energy range from 1 keV to 10 keV. The instrument can accept samples up to a size of 50x50x10 mm.

Instrument data

  • Ion source: Ar
  • Accelerating voltage: 1 to 10 kV
  • Equipped with cooling stage

Contact persons

Stefan Gustafsson
  • Senior Research Engineer, CMAL, Physics
Ludvig de Knoop
  • Senior Research Engineer, CMAL, Physics