SOFT Microscopy: New electron microscopes to CMAL

​Three new state-of-the-art electron microscopes will be installed during 2017-2018.
The microscopes, a JEOL JEM-ARM200F transmission electron microscope (TEM), a JEOL JSM-7800F Prime scanning electron microscope (SEM) and a TESCAN GAIA3 focused ion beam SEM (FIB-SEM), have been bought with the help of funding from the Knut and Alice Wallenberg Foundation. The SEM and the FIB-SEM are expected to be installed during early 2017 and the TEM during spring 2018.
With the new microscopes in place new possibilities for studying soft matter and beam sensitive materials in a range of different research fields open up.

For more information, please contact Head of Laboratory Anders Kvist.

Page manager Published: Tue 13 Dec 2016.