The
NanoSIMS 50L in Gothenburg is the first of these instruments in
Scandinavia. A nanoSIMS offers μg/g
or better detection limits for most elements, essentially periodic table
coverage, 50 nm imaging and depth profiling capabilities, and isotopic analyses
of major and minor elements on a wide range of materials. The NanoSIMS is
suitable for a wide variety of applications, for example, grain boundary
analysis, characterization of stress corrosion cracking, sub-cellular
drug/peptide imaging and nitrogen fixation studies in bacteria.
Cameca NanoSIMS 50L
The CAMECA NanoSIMS 50L is a unique ion
microprobe optimizing SIMS analysis performance at high lateral
resolution. It is based on a coaxial optical design of the ion gun and
the Secondary ion extraction, and on an original magnetic sector mass
analyzer with multicollection. NanoSIMS 50L delivers simultaneously several key
performances that can only be obtained individually with any other known
instrument or technique:
- High analysis spatial resolution (down to 50 nanometers)
- High sensitivity (ppm in element imaging),
- High Mass Resolution (M/dM),
- Parallel acquisition of seven masses,
- Fast acquisition (DC mode, not pulsed),
- Analysis of electrically insulating samples without problem.
And thanks to recent improvements,
isotope ratio reproducibility of a few tenths of permil can now be achieved.