During the spring of 2017 there has been a lot of new instruments installed in the Chalmers Materials Analysis Laboratory. The new additions to the CMAL lab include:
FIBSEM: A TESCAN focused ion-beam (GAIA3) equipped with detectors and software for 3D EDX and EBSD analysis, equipment for cryo applications as well as micro manipulators for in-situ studies was installed in January/February.
SEM: A JEOL scanning electron microscope (JSM 7800 Prime) equipped with an EDX detector and a SXES detector (for detection of low-energy x-rays) arrived in February.
Elemental analysis: A vario MICRO cube from Elementar was installed in March. The instrument allows for analysis of CHNS in organic samples with a mass up to around 10 mg.
SAXS: A Small Angle X-ray Scattering instrument from SAXSLAB (Mat:Nordic) was installed in March. The instrument allows for SAXS, WAXS, GISAXS, GIWAXS, simultaneous SAXS and WAXS and simultaneous GISAXS and GIWAXS measurements.
FTIR microscope/spectrometer: A confocal Hyperion3000 microscope in combination with a Vertex70v spectrometer from Bruker was installed in April. Both the microscope and the spectrometer allows for ATR measurements and the microscope is equipped with a gracing incident reflection objective to allow for monolayer analysis.
CLSM: A Confocal Laser Scanning Microscope, Ti-E A1+ from Nikon, has been installed in May. The microscope is equipped with a 4 channel detector unit (2 PMT, 2 GaAsP) allowing for simultaneous imaging of up to 4 channels, and one spectral detector unit (GaAsP). A stage-top incubator with temperature and CO2 regulation is also be available.
To sum up, there will be lots of new exciting analysis possibilities for all CMAL users in the near future. If you are interested in using an instrument, don't hesitate to contact us.