FEI Tecnai T20

This is a 200 kV TEM/STEM with a LaB6 filament. The microscope may also be used at lower accelerating voltages, down to 80 kV. It is equipped with a high-angle annular dark-field STEM detector, an EDS system and software for performing tomography in both TEM and STEM mode. Holders for dynamic in situ STM and AFM experiments from Nanofactory Instruments are also available.

The instrument can be booked here. For more information, please contact Research Engineer Stefan Gustafsson.

Instrument data:

•    Operating voltage: 80, 120 and 200 kV
•    Gun: LaB6
•    Equipped with:
     - HAADF-STEM detector
     - Orius CCD camera
     - EDAX X-ray system

Published: Tue 17 Jun 2014. Modified: Fri 01 Feb 2019