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Chalmers Materials Analysis Laboratory
  • About us
  • News
  • Contact
  • Instruments
    • Atom Probe Tomography (APT)
      • IMAGO LEAP 3000X HR
    • Combustional elemental analysis
    • Confocal laser scanning microscope (CLSM)
    • FTIR microscope/spectrometer
    • Ion-Beam techniques
      • Broad Ion-Beam (BIB)
        • Fischione Low Angle Ion Milling & Polishing System Model 1010
        • Gatan Precision Ion Polishing System Model 691
        • Leica EM TIC 3X
      • Focused Ion-Beam (FIB)
        • FEI Versa3D LoVac DualBeam
        • Tescan GAIA3
    • Raman microscope
    • Scanning Electron Microscopy (SEM)
      • FEI Quanta200 ESEM
      • LEO Ultra 55
      • JEOL JSM-7800F Prime
    • Spectrophotometer
      • Horiba Fluorolog 3 FL3-22
    • Surface Plasmon Resonance (SPR)
      • BioNavis SPR Navi 220A
    • Transmission Electron Microscopy (TEM)
      • FEI Tecnai T20
      • FEI Titan 80-300
      • JEOL MonoNEOARM200F
    • UV-Vis spectrophotometer
      • Agilent Cary 60
    • X-ray photoelectron spectrometer (XPS)
    • X-ray Scattering
      • Bruker D8 Advance
      • Bruker D8 Discover
      • Mat:Nordic SAXS/WAXS/GISAXS
  • Access and booking
  • Workshops and Courses
Featured Image (Width 750px, Height 340px)
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X-ray Scattering


Bruker D8 Advance​

Bruker D8 Discover

Mat:Nordic SAXS/WAXS/GISAXS​​

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