ToF-SIMS samples and materials

Types of materials

ToF-SIMS can analyze solids, powders, porous materials, glasses, thin films, layered materials/devices, 2D atomic layers.  

Sample requirements

Sample must be high vacuum compatible. Optimal size is ca 10 mm x 10 mm with a maximum thickness of 8 mm. Larger samples up to 10 cm x 8 cm x 2 cm can be loaded using a special holder.