The techniques that are available at Chalmers Materials Analysis Laboratory are listed below. Follow the links to get more information on what instruments and tools we have.
Atom probe tomography
Atom Probe Tomography (APT) is a technique that provides 3D atom-by-atom imaging of materials with a uniquely powerful combination of spatial and chemical resolution.
Electron microscopy
Scanning electron microscopy (SEM) Transmission electron microscopy (TEM) Focused ion beam SEM (FIB-SEM)
Optical microscopy/spectroscopy
XPS
During fall 2026 the state of the art HiPP Lab ambient pressure XPS from Scienta Omicron will be installed in the lab.
X-ray scattering
At CMAL we have two powder XRDs, one single crystal XRD and one SAXS. Follow the links below to learn more about them.
TOF-SIMS
Time-of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS) is a powerful tool to study the surface chemistry and composition of materials at a the nano scale.
