Broad Ion Beam (BIB)
Ion milling and polishing: Fishione 1010
The Fischione Ion Mill is used for producing TEM specimens with large electron transparent areas. Samples are pre-thinned by e.g. mechanical grinding and polishing or chemical polishing. The milling or polishing is performed by argon ions. The instrument has two independently adjustable Hollow Anode Discharge (HAD) argon ion sources, which can be operated from 0.5 to 6.0 kV with currents from 3 mA to 8 mA. The milling angle can be adjusted in the range of 0° to 45°. Tuning the milling parameters allows for coarse or gentle milling and the goal is to get clean samples free of physical or chemical artifacts.
Instrument data
- Ion source: Ar
- Accelrating voltage: 0.5 kV to 6.0 kV
- Source current: 3 mA to 8 mA
- Milling angle: 0-45°
- Equipped with cooling stage
Cutting and polishing: Leica EM TXP
The Leica EM TXP is device for cutting and polishing samples prior examination by SEM, TEM and light microscopy techniques.
Instrument data
- Modes: milling, sawing, drilling, grounding and polishing
- Cutter speed: 300-20000 rpm
- Manual feed in steps of 0.5, 1, 10 and 100 μm
Sputter coater: Leica EM ACE600
The Leica EM ACE 600 is a fully automated sputter coater, mainly used to to prepare samples for TEM analysis.
Instrument data
- Sources: Au, Cr, Pt
- Coating thickness : 1-1000 nm
Other
Low speed saw
Mounting press
Stereo light microscopes
Ultrasonic bath cleaner
Chemical lab