25 - 27 October, 2016
SEM 2016 had a focus on basic principles in scanning
electron microscopy and microanalysis. The course covered
instrumentation and techniques for imaging and analysis under different
vacuum conditions, and at high as well as low acceleration voltages.
Different procedures in qualitative and quantitative XEDS analysis were
discussed. SEM 2016 was the 15th course given by Chalmers Microscopy
School. The invited lectures this year were given by Professor Brad
Thiel from SUNY Polytechnic Institute, Albany, USA. The laboratory
sessions were carried out on equipment from Bruker, Fei, Jeol, Hitachi,
Oxford Instruments, Phenom World, TESCAN and Zeiss.