SEM 2014, 28-30 October, had a focus on imaging
and analysis in the SEM and FIB/SEM, and was the 13th course given
by Chalmers Microscopy School. Lectures
were given by European and Canadian application specialists from Bruker, Fei,
Hitachi, Jeol, Oxford Instruments, PhenomWorld and Zeiss. The laboratory sessions were carried out on
equipment from these companies.
Download the programme