SEM School 2014

SEM 2014, 28-30 October, had a focus on imaging and analysis in the SEM and FIB/SEM, and was the 13^th course given by Chalmers Microscopy School.  Lectures were given by European and Canadian application specialists from Bruker, Fei, Hitachi, Jeol, Oxford Instruments, PhenomWorld and Zeiss.  The laboratory sessions were carried out on equipment from these companies.

Download the programme