Scope

Characterizing surfaces from a mechanical, structural and chemical perspective has become a standard requirement in a number of processes where surfaces play a crucial role. This extends from biophysical processes in cell membranes to functional coatings in airplane wings. Within the portfolio of techniques capable of interrogating surfaces, surface sensitive vibrational spectroscopy and specifically, scanning probe techniques play an ever important role. Here we will focus on understanding the principles of these techniques, including their advantages and limitations.

Learning objectives

The purpose of this course is to give the participants an introduction to atomic force microscopy (AFM) and surface specific vibrational spectroscopies. Today, these experimental techniques have found wide range of applications with numerous references in the scientific literature. In order to identify problems where these tools can provide useful answers, as well understanding the conclusions based on results obtained with these techniques, a deeper insight into their strength and potential limitations is required.

After following the course the participant should be able to

•       describe  the basic operation of an atomic force microscope (AFM)
•        understand the principles of AFM based imaging and force measurements
•        explain the fundamental principles of some specific surface sensitive spectroscopic techniques    (SFG or VSFS, TIR Raman, IRRAS)
•        understand how to extract chemical, structural and compositional information from the spectra
•        perform simple image analysis
•        identify areas in their own research where these technique can be applied
•        critically read scientific articles containing result from these techniques

Time

Start: September 17 at 13.00.

End: September 19, at 13.00.

Place

Marstrand, 45 minutes drive north of Göteborg. We will be staying at Hotel Nautic, a small hotel right in the middle of the little town. The lectures will be held at Carlstens fästning, the old fortress, which is a few minutes walk away from the hotel.

Course content

Basic AFM operations, AFM based imaging, force and friction measurements, and single molecule studies. Basic tools for image analysis. Sum Frequency spectroscopy and TIR Raman spectroscopy.  Chemical and compositional analysis. Spectral imaging. Surface molecular structure. Combined scanning probe with spectroscopy (SNOM).

Lecturers

Esben Thormann, Royal Institute of Technology (KTH), esben@kth.se
Eric C. Tyrode, Royal Institute of Technology (KTH), tyrode@kth.se

Preliminary program

Program.pdf

Course literature

Lecture notes will be handed out at the beginning of the course.

Registration

Send an email to Esben Thormann; esben@kth.se

Points

4  ECTS is recommended for students who have actively participated during the course and submitted satisfactory answers to the questions handed out during the course.