The Leica EM TIC 3X Triple Ion-Beam Cutter is used for producing large, broad cross sections; up to a few millimeters in width and several hundred microns in depth, of samples for subsequent electron microscope or light microscope examination. A wide range of samples, including polymers, metal and semiconductors can be processed. The milling is performed by argon ion beams in the energy range from 1 keV to 10 keV. The instrument can accept samples up to a size of 50x50x10 mm.
For more information, please contact Research Engineer Stefan Gustafsson or Ludvig de Knoop.
• Ion source: Ar
• Accelerating voltage: 1 to 10 kV
• Equipped with cooling stage