Take the chance to learn about new developments in focused ion beam and scanning electron microscopy!
October 23-25, 2018
The three-day course SEM 2018 will focus on advanced techniques in imaging and microanalysis. X-ray mapping with particle analysis and the theory and application of electron backscatter diffraction (EBSD) and transmission Kikuchi diffraction (TKD) will be covered. The acquisition and use of different types of images and maps in 3D reconstruction of materials microstructures will also be discussed. SEM 2018 will combine theory and practical experience. The lectures in the morning sessions will give a background to the afternoon laboratory sessions. Bring your own specimens to the Open Lab evening sessions.
The laboratory sessions will be carried out on SEMs and FIB/SEMs with surrounding interactive equipment for chemical and structural analysis. Top-of-the-line instrumentation will be brought to Chalmers specifically for SEM 2018 by the participating companies. Come and meet fellow microscopists and company representatives for interesting discussions.
Welcome to SEM 2018!
Lena Falk and Mats Halvarsson
18 October is the last day to register for SEM 2018.