Photo from SEM School 2016

SEM School 2016

​25 - 27 October, 2016

SEM 2016 had a focus on basic principles in scanning electron microscopy and microanalysis.  The course covered instrumentation and techniques for imaging and analysis under different vacuum conditions, and at high as well as low acceleration voltages.  Different procedures in qualitative and quantitative XEDS analysis were discussed.  SEM 2016 was the 15th course given by Chalmers Microscopy School.  The invited lectures this year were given by Professor Brad Thiel from SUNY Polytechnic Institute, Albany, USA.  The laboratory sessions were carried out on equipment from Bruker, Fei, Jeol, Hitachi, Oxford Instruments, Phenom World, TESCAN and Zeiss.



Published: Tue 16 May 2017.