20 - 22 October, 2015
SEM 2015 had a focus on instrumentation and techniques for imaging and microanalysis down to nanometer resolution and at low acceleration voltages. Optimum specimen preparation of different materials with different techniques was also discussed. SEM 2015 was the 14th course given by Chalmers Microscopy School. Lectures were given by application specialists from Bruker, Fei, Hitachi, Jeol, Leica Microsystems, Oxford Instruments, Phenom-World, Spectral Solutions, Tescan and Zeiss. The laboratory sessions were carried out on equipment from these companies.