SEM School 2014



SEM 2014, 28-30 October, had a focus on imaging and analysis in the SEM and FIB/SEM, and was the 13th course given by Chalmers Microscopy School.  Lectures were given by European and Canadian application specialists from Bruker, Fei, Hitachi, Jeol, Oxford Instruments, PhenomWorld and Zeiss.  The laboratory sessions were carried out on equipment from these companies.

 
 

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Published: Thu 12 Mar 2015. Modified: Fri 13 Mar 2015