SEM School 2013

SEM 2013, 15- 17 October, had a focus on chemical analysis with XEDS in the SEM and FIB/SEM, and was the 12th course given by Chalmers Microscopy School.  The invited lectures this year were given by Dr Mathias Procop from the IfG-Institute for Scientific Instruments in Berlin, Germany.

The laboratory sessions were carried out on equipment from Bruker, Fei, Hitachi, Jeol, Oxford Instruments and Zeiss.  Application specialists from these companies contributed with lectures in the morning sessions, and also with oral presentations during the lab sessions.

Download the programme​

Published: Thu 17 Apr 2014.