SEM 2013, 15- 17 October, had a focus on chemical analysis
with XEDS in the SEM and FIB/SEM, and was the 12th course given by
Chalmers Microscopy School. The invited
lectures this year were given by Dr Mathias Procop from the IfG-Institute
for Scientific Instruments in Berlin, Germany.
The laboratory sessions were
carried out on equipment from Bruker, Fei, Hitachi, Jeol, Oxford Instruments
and Zeiss. Application specialists from
these companies contributed with lectures in the morning sessions, and also
with oral presentations during the lab sessions.
Download the programme