SEM 2012, 23 – 25 October, had a focus on in-situ SEM and FIB/SEM techniques, and was the 11th
course given by Chalmers Microscopy School.
The invited lectures this year were given by Professor Ed Boyes,
University of York, UK and Professor Brad Thiel, University at Albany, USA.
The laboratory sessions were
carried out on equipment from Bruker, Fei, Hitachi, Kleindiek, Oxford
Instruments, Quorum Technologies and Zeiss.
Application specialists from these companies contributed with lectures
in the morning sessions, and also with oral presentations during the lab
Download the programme