SEM School 2012


SEM 2012, 23 – 25 October, had a focus on in-situ SEM and FIB/SEM techniques, and was the 11th course given by Chalmers Microscopy School.  The invited lectures this year were given by Professor Ed Boyes, University of York, UK and Professor Brad Thiel, University at Albany, USA.

The laboratory sessions were carried out on equipment from Bruker, Fei, Hitachi, Kleindiek, Oxford Instruments, Quorum Technologies and Zeiss.  Application specialists from these companies contributed with lectures in the morning sessions, and also with oral presentations during the lab sessions.



Download the programme

Published: Thu 17 Apr 2014.