Transmission electron microscopy (TEM) is powerful for the research and development in materials, nanostructures and nano-devices due to its ability to provide local quantitative information about the structure and chemistry at the atomic level and also about the properties. In many cases the corresponding information is not accessible using other techniques. The aim of this workshop is to illustrate the potential and insights that in situ (TEM) and scanning TEM (STEM) provide for studies of materials and the correlation between structure and properties. It will also address the possibilities enabled by the introduction of aberration correctors and monochromators in the electron column.
In situ experiments allowing time resolved dynamic experiments involving gases, liquids, electric fields, magnetic fields, optical excitation as well as manipulation with STM and AFM tips is a rapidly expanding field of research. The development of holders that allow the in situ experiments is in rapid progress and will be illustrated in the presentations. In addition, electron energy loss spectroscopy (EELS) and other types of spectroscopy further expand the capabilities giving additional information about structure and properties. Soft materials with low density and interfaces between hard and soft materials pose new challenges where low voltage TEM and STEM are giving new opportunities. Aspects of electron beam specimen interaction and data evaluation will be discussed.
Confirmed invited speakers:
David Bell, Harvard University, USA.
John Cumings, University of Maryland, USA.
Caterina Ducati, Cambridge University,
Rafal Dunin Borkowski, ER-C Jülich Research Center, Jülich, Germany.
Christoph Gammer, Lawrence Berkeley National Laboratory, USA.
Max Haider, CEOS Heidelberg, Germany.
Florent Houdellier, CEMES CNRS Toulouse, France.
Yuichi Ikuhara, University of Tokyo, Japan. A KVA-JSPS talk.
Niels de Jonge, Leibniz Institute for New Materials Saarbrücken, Germany.
Wolfgang Jäger, Christian-Albrechts-University Kiel, Germany.
Mathieu Kociak, University of Paris-Sud Orsay, France.
Ludvig de Knoop, Chalmers University of Technology Gothenburg, Sweden.
Ai Leen Koh, Stanford University, USA.
Velimir Radmilovic, University of Belgrade, Serbia.
Harald Rose, University of Ulm, Germany.
Wilfried Siegle, Max-Planck-Institute Stuttgart, Germany.
Robert Sinclair, Stanford University, USA.
Erdmann Spiecker, Friedrich-Alexander Universität Erlangen-Nürnberg, Germany.
Kazu Suenaga, National Institute of Advanced Industrial Science and Technology Tsukuba, Japan.
Seiji Takeda, Osaka University, Japan.
Toshiaki Tanigaki, Hitachi, Ltd., Hatoyama, Saitama, Japan
Norvik Voskanian, Chalmers University of Technology Gothenburg, Sweden.