Measurement and analysis of small scale geometry
Presenter: Johan Berglund
Time: Friday April 21, 14.00-15.00
Local: Virtual Development Laboratory, entrance via Hörsalsvägen 7A
Research group: Geometry Assurance & Robust Design/Swerea IVF
For quality assurance of components with small features or small but critical defects it can be necessary to measure geometry at very high resolution. Using optical surface topography instruments it is possible to achieve a lateral resolution down to a fraction of a micron and sub nanometre vertical resolution. Fusing data from topography instruments with data from 3d scanning it is possible to perform geometry analysis with high resolution in selected areas.
Example applications for this technology can be geometry assurance of 3d printed parts which typically have rough surfaces and at the same time can have small features with form tolerances in the same range as the surface roughness. Another application can be sink marks and other defects with shallow depth, in the range of microns, and larger lateral extension, in the range of millimetres.
Johan Berglund is a guest researcher in the group Geometry Assurance & Robust Design since October 2016 employed by Swerea IVF where he works with surface topography analysis and sheet metal forming.
21 April, 2017, 14:00
21 April, 2017, 15:00